Dataset Exploring high-frequency eddy-current testing for sub-aperture defect characterisation using parametric-manifold mapping/Notch Characterisation/CT Images Back to top level Exploring high-frequency eddy-current testing for sub-aperture defect characterisation using parametric-manifold mapping Up one level Exploring high-frequency eddy-current testing for sub-aperture defect characterisation using parametric-manifold mapping/Notch Characterisation Data Resources TB001 1.jpg JPEG Explore Preview Download TB001 2.jpg JPEG Explore Preview Download TB001 3.jpg JPEG Explore Preview Download